Ru-Based Thin Film Temperature Sensor for Space Environments: Microfabrication and Characterization under Total Ionizing Dose

Author:

Ravelo Arias S. I.1,Ramírez Muñoz D.1ORCID,Cardoso Susana2,Freitas Paulo P.23

Affiliation:

1. Department of Electronic Engineering, University of Valencia, Avenida de la Universitat, s/n, 46100 Burjassot, Spain

2. INESC Microsystems and Nanotechnologies (INESC-MN) and Physics Department, Instituto Superior Técnico, Lisbon University, R. Alves Redol 9, 1000-029 Lisbon, Portugal

3. International Iberian Nanotechnology Laboratory (INL), Avenida Mestre José Veiga, 4715-31 Braga, Portugal

Abstract

The paper shows the microfabrication processes of a Ruthenium-based resistance temperature detector and its behavior in response to irradiation at ambient temperature. The radiation test was done in a public hospital facility and followed the procedures based on the ESA specification ESCC 22900. The instrumentation system used for the test is detailed in the work describing the sensors resistance evolution before, during, and after the exposure. A total irradiation dose of 43 krad with 36 krad/h dose rate was applied and a subsequent characterization was performed once the Ru sensors were submitted to an 80°C annealing process during a period of 168 h. The experimental measurements have shown the stability of this sensor against total ionizing dose (TID) tests, not only in their resistance absolute values during the irradiation phase but also in the relative deviation from their values before irradiation.

Funder

Ministerio de Economía y Competitividad

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Instrumentation,Control and Systems Engineering

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3