Affiliation:
1. Brigham Young University, Provo 84602, UT, USA
Abstract
This paper presents an overview of Zener zap anti-fuse trim as used to achieve improved
accuracy in precision integrated circuits. Because this technology spans design and manufacturing,
elements of design, layout, processing, and testing are included. The mechanism is
defined and typical applications are discussed. Layout considerations of anti-fuse devices are
summarized and complex trim networks and multiplexed control methods are presented.
Both bipolar and CMOS process implementations are considered. The paper also contains a
bibliography which includes U.S. patents, which make up a large part of the technical
documentation of this technology.
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Hardware and Architecture
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献