A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach

Author:

Soares Augusto José A.12,Beltrán Almeida Carlos23

Affiliation:

1. Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, Campo Grande, Edifício C8, 1749-016 Lisboa, Portugal

2. Instituto de Engenharia de Sistemas e Computadores Investigação e Desenvolvimento em Lisboa (INESC-ID), Rua Alves 9, Apartado 13069, 1000-029 Lisboa, Portugal

3. Departamento de Engenharia Electrotécnica e de Computadores, Instituto Superior Técnico, Universidade Téecnica de Lisboa, Avenida Rovisco Pais, 1049-001 Lisboa, Portugal

Abstract

In previous works of these authors, a technique for doing single-fault diagnosis in linear analog circuits was developed. Under certain conditions, one of them assuming nominal values for the circuit parameters, it was shown that only two measurements taken on two selected circuit nodes, at a single frequency, were needed to detect and diagnose any parametric fault. In this paper, the practical value of the technique is improved by extending the application to the diagnosis of faults in circuits with parameters subject to tolerance. With this in mind, single parametric faults with several strengths are randomly injected in the circuit under study and, afterwards, these faults are diagnosed (or the diagnosis fails). Results are reported on a simple active filter. Conclusions are drawn about the robustness and effectiveness of the technique.

Funder

Fundação para a Ciência e a Tecnologia

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Hardware and Architecture

Reference16 articles.

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