Affiliation:
1. Eindhoven University of Technology, Department of Electrical Engineering, Eindhoven, The Netherlands
Abstract
Our simple model of the noise of a thick-film resistor leads to two limiting cases. For thick-film resistors with a conduction dominated by the glass interface, the relative noise is proportional to the sheet resistance, R□. For thick film resistors, where the conduction is mainly dominated by the current constrictions in the contact areas between grains, the relative noise is proportional toR□3. Both trends have been observed. Some criteria of low-noise thick-film resistors are derived from the developed noise relations.The major conclusion is that measurements of the noise index are a nondestructive way to check quantitatively the operations used to manufacture high-quality thick-film resistors. Inadequate materials or treatments, weak or brittle wire bonds and reliability are easily detected by 1/f noise measurements.
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
43 articles.
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