Study on UV/O3 Cleaning by Xe2*Excimer Lamp
Author:
Affiliation:
1. USHIO INC.
2. USHIO Research Institute of Technology Inc.
Publisher
Illuminating Engineering Society of Japan
Subject
Electrical and Electronic Engineering
Link
https://www.jstage.jst.go.jp/article/jieij1980/83/5/83_5_273/_pdf
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Optimization of gas-flow condition for a real scale semiconductor packaging process using the Photodesmear® method;Japanese Journal of Applied Physics;2022-07-25
2. Full-Sized Panel Photodesmear for Via Residue Cleaning;2016 IEEE 66th Electronic Components and Technology Conference (ECTC);2016-05
3. Understanding TiO2 Photocatalysis: Mechanisms and Materials;Chemical Reviews;2014-09-19
4. Evaluation of Vacuum Ultraviolet Irradiation Influence under Xenon Excimer Lamp Processing Employing a Quartz Crystal Microbalance with Organic Thin Film;Japanese Journal of Applied Physics;2013-05-01
5. Resist Removal Method using Xe2 Excimer Ultraviolet Light;Journal of Photopolymer Science and Technology;2011
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