Author:
Chapman N.,Prince K.,Evans P.,Radke F.,Hayward P.,Lester N.
Subject
Geochemistry and Petrology,Geotechnical Engineering and Engineering Geology,General Chemistry
Reference3 articles.
1. Ion microprobe trace-element analysis of silicates: Measurement of multi-element glasses
2. L. C. Feldman and J. W. Mayer: ‘Fundamentals of surface and thin film analysis’, 13-68; 1986, New York, North Holland-Elsevier.
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2 articles.
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