Preliminary studies using imaging mass spectrometry TOF-SIMS in detection and analysis of fingerprints
Author:
Publisher
Informa UK Limited
Subject
Computer Vision and Pattern Recognition,Media Technology
Link
http://www.tandfonline.com/doi/pdf/10.1179/174313107X177657
Reference13 articles.
1. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
2. Advanced time-of-flight secondary ion mass spectrometry analyses for application to TFT-LCD
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