Influence of post-deposition annealing time on oxygen gas sensing behaviour of Al/La0·50Ce0·50O1·75/Si metal-oxide-semiconductor capacitor
Author:
Affiliation:
1. Electronic Materials Research GroupSchool of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia, 14300 Nibong Tebal, Seberang Perai Selatan, Penang, Malaysia
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1179/1432891714Z.0000000001031
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