X-ray residual stress analysis in thin films under grazing incidence – basic aspects and applications
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/174328405X14100
Reference22 articles.
1. Diffraction Stress Analysis in Thin Films and Coatings--Problems, Methods and Perspectives
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