Characterisation of rare earth minerals with field emission scanning electron microscopy
Author:
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Metals and Alloys
Link
http://www.tandfonline.com/doi/pdf/10.1179/1879139513Y.0000000086
Reference14 articles.
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3. EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector
4. M Spectra of the Rare Earth Elements Measured with an Ultra-Thin Window Si(Li) Detector
5. Rasband WS: ‘ImageJ’, in ‘US National Institutes of Health 1997-2012’, Bethesda, MD, USA, http://imagej.nih.gov/ij/
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