Electron backscatter diffraction and orientation imaging microscopy
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/mst.1997.13.1.69
Reference12 articles.
1. High-angle Kikuchi patterns
2. Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope
3. Accurate microcrystallography using electron back-scattering patterns
4. Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscope
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