Characterisation of surface texture using AFM with trimmed probe tip
Author:
Publisher
Informa UK Limited
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1179/174327806X124690
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1. The Topografiner: An Instrument for Measuring Surface Microtopography
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3. Atomic Force Microscope
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