Affiliation:
1. College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China
Abstract
Background:
In the face of the development trend of high-end manufacturing servitization,
the reliability standard of manufacturing products gradually increases.
Objective:
In order to accurately predict the product life cycle, the accelerated degradation evaluation
technology could be applied to significantly shorten the experiment duration. As the technologies of intelligent
manufacturing and industrial big data develop, the theory of accelerated degradation evolves as
well.
Methods:
Based on the scientific knowledge mapping, co-author network and co-existence network,
22283 pertinent articles since the year 2010 have been collected to conduct a bibliometric study.
Results:
The results show that the accelerated degradation reliability assessment spans over many research
fields, and achieves great development in the mathematical modeling and experiment verification.
Conclusion:
To further the study, more efforts are expected in the areas such as building effective evaluation
systems and enhancing the credibility of the assessment outcomes, as more advanced sensory data
and wireless communication technologies become available.
Funder
Natural Science Foundation of China
Zhejiang Provincial Natural Science Foundation of China
Publisher
Bentham Science Publishers Ltd.
Subject
General Materials Science
Reference84 articles.
1. Huang Q.; He J.; The core capability, function and strategy of Chinese manufacturing industry: Comment on “Chinese Manufacturing 2025”. China Industrial Economics 2015(06),5-17
2. Shi J.; Liu Z.; Zhang H.; Life cycle assessment: State of the art and future perspectives. Recent Pat Mech Eng 2015,8(3),211-221
3. Nobile L.; Gentilini C.; Three dimensional frame structures with edge-cracks of uncertain depth and location. Recent Pat Mech Eng 2008,1(1),12-21
4. Simoni L.; Mazzanti G.; Montanari G.C.; A general multi-stress life model for insulation materials with or without evidence for thresh-olds. IEEE Trans Electr Insul 1993,28(3),349-364
5. Lu C.J.; Meeker W.Q.; Using degradation measures to estimate a time to failure distribution. Technometric 1993,35(2),161-167
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