High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale-Reference-Cited by-同舟云学术

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High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale

Published:2006-11-01 Issue:4 Volume:2 Page:337-350
ISSN:1573-4137
Container-title:Current Nanoscience
language:en
Short-container-title:CNANO

Author:

Rockstuhl Carsten,Marki Iwan,Scharf Toralf,Salt Martin,Peter Herzig Hans,Dandliker Rene

Publisher

Bentham Science Publishers Ltd.

Subject

Pharmaceutical Science,Biomedical Engineering,Medicine (miscellaneous),Bioengineering,Biotechnology

Cited by 33 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. On the features of the interference of a set of single charged optical vortices for non-contact surface roughness analysis;SPIE Future Sensing Technologies;2020-11-08

3. Near-field phase profile and far-field contrast modulation for micro-lens arrays at the refraction limit;SN Applied Sciences;2020-11-08

4. High-quality single crystal diamond diffraction gratings fabricated by crystallographic etching;Optics Express;2019-10-07

5. High-resolution interference microscopy of binary phase diffractive optical elements;OSA Continuum;2019-08-16

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