A Pathological Brain Detection System based on Extreme Learning Machine Optimized by Bat Algorithm-Reference-Cited by-同舟云学术

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A Pathological Brain Detection System based on Extreme Learning Machine Optimized by Bat Algorithm

Published:2017-01-11 Issue:1 Volume:16 Page:23-29
ISSN:1871-5273
Container-title:CNS & Neurological Disorders - Drug Targets
language:en
Short-container-title:CNSNDDT

Author:

Lu Siyuan,Qiu Xin,Shi Jianping,Li Na,Lu Zhi-Hai,Chen Peng,Yang Meng-Meng,Liu Fang-Yuan,Jia Wen-Juan,Zhang Yudong

Publisher

Bentham Science Publishers Ltd.

Subject

Pharmacology,General Neuroscience

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