Survey on industrial defect detection with deep learning
Author:
Publisher
Science China Press., Co. Ltd.
Subject
Engineering (miscellaneous),General Computer Science
Link
https://engine.scichina.com/doi/pdf/0F6CC4DCDA9549C9BC85B42F56CF1310
Reference206 articles.
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4. Bulusu S, Kailkhura B, Li B, et al. Anomalous instance detection in deep learning: a survey. In: Proceedings of the 42nd lEEE Symposium on Security and Privacy Princeton, 2020.
5. Ruff L, Kauffmann J R, Vandermeulen R A. A Unifying Review of Deep and Shallow Anomaly Detection. Proc IEEE, 2021, 109: 756-795.
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