The open-pin failure of power device under the combined effect of thermo-migration and electro-migration
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Published:2020-04-24
Issue:20
Volume:65
Page:2169-2177
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ISSN:0023-074X
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Container-title:Chinese Science Bulletin
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language:en
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Short-container-title:Chin. Sci. Bull.
Author:
Gao Liyin,Li Caifu,Cao Lihua,Liu Zhiquan
Publisher
Science China Press., Co. Ltd.
Subject
Multidisciplinary