Control of geometrical sources of error in residual stress analysis by energy-dispersive X-ray diffraction

Abstract

A theoretical expression that describes the influence of instrumental errors in the determination of residual stress by energy-dispersive X-ray diffraction (EDXRD) is derived. The calculation predicts the shift in the diffraction peak energy with variation in the angle Ψ as a function of the misalignment parameters. A simple model that allows evaluation and monitoring of instrumental adjustment for residual stress measurements by EDXRD is shown. Good agreement between experimental and theoretical data is obtained using the model developed.