Analysis of speckle patterns in electronic devices for the monitoring of current changes

Abstract

Derived from new advances technological focused on the development of highly functional electronic devices; the manufacturers are obliged to the implementation of techniques to monitor their behavior. These techniques can be destructive or non-destructive, taking the analyzed device to the maximum working range. In this investigation report we show of the results obtained in the study of the speckle patterns of a positive voltage regulator, we used the probability density function and the correlation coefficients, as a statistical analysis of first and second order. The analysis was realized in each terminal of the electronic device, with changes in the input current. The result obtained suggest that the first and second order statistical analysis are good tool in a not destructive measurement and that its results can be relationship with the supply current. These changes are present a behavior ascending as the device operates in the junction temperature range; presenting itself as a mechanism for transmission and convection of heat, using the random distribution of speckle pattern, taking to optical measurement as an technique alternative in the study of electronic devices.