A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

Author:

Vinco Sara1ORCID,Bombieri Nicola2ORCID,Pagliari Daniele Jahier1ORCID,Fummi Franco2,Macii Enrico1ORCID,Poncino Massimo1ORCID

Affiliation:

1. Politecnico di Torino, Turin, Italy

2. University of Verona, Verona, Italy

Abstract

Smart systems are characterized by the integration in a single device of multi-domain subsystems of different technological domains, namely, analog, digital, discrete and power devices, MEMS, and power sources. Such challenges, emerging from the heterogeneous nature of the whole system, combined with the traditional challenges of digital design, directly impact on performance and on propagation delay of digital components. This article proposes a design approach to enhance the RTL model of a given digital component for the integration in smart systems with the automatic insertion of delay sensors, which can detect and correct timing failures. The article then proposes a methodology to verify such added features at system level. The augmented model is abstracted to SystemC TLM, which is automatically injected with mutants (i.e., code mutations) to emulate delays and timing failures. The resulting TLM model is finally simulated to identify timing failures and to verify the correctness of the inserted delay monitors. Experimental results demonstrate the applicability of the proposed design and verification methodology, thanks to an efficient sensor-aware abstraction methodology, by applying the flow to three complex case studies.

Publisher

Association for Computing Machinery (ACM)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Reference52 articles.

1. Accellera. 2006. IEEE Standard SystemC Language Reference Manual. Retrieved from http://ieeexplore.ieee.org. Accellera. 2006. IEEE Standard SystemC Language Reference Manual. Retrieved from http://ieeexplore.ieee.org.

2. A comprehensive model for PMOS NBTI degradation: Recent progress

3. A comprehensive model for PMOS NBTI degradation: Recent progress

4. J. R. Armstrong F. S. Lam and P. C. Ward. 1992. Test Generation and Fault Simulation for Behavioral Models. Prentice Hall. J. R. Armstrong F. S. Lam and P. C. Ward. 1992. Test Generation and Fault Simulation for Behavioral Models. Prentice Hall.

5. Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code

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