Fault Classification and Coverage of Analog Circuits using DC Operating Point and Frequency Response Analysis-Reference-Cited by-同舟云学术

Fault Classification and Coverage of Analog Circuits using DC Operating Point and Frequency Response Analysis

Published:2019-05-13 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 2019 on Great Lakes Symposium on VLSI
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Author:

Sanyal Sayandeep¹,Garapati Shan Pavan Pani Krishna¹,Patra Amit¹,Dasgupta Pallab¹,Bhattacharya Mayukh²

Affiliation:

1. Indian Institute of Technology Kharagpur, Kharagpur, India

2. Synopsys Inc., San Francisco, CA, USA

Funder

Synopsys

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3299874.3317976

Reference19 articles.

1. Optimization of analog fault coverage by exploiting defect-specific masking

2. dendextend: an R package for visualizing, adjusting and comparing trees of hierarchical clustering

3. Nuno Guerreiro Marcelino Santos and J. P. Teixeira. 2013. Analogue and Mixed-Signal Production Test Speed-Up by Means of Fault List Compression. Vol. 04 (2013) 407--421. Nuno Guerreiro Marcelino Santos and J. P. Teixeira. 2013. Analogue and Mixed-Signal Production Test Speed-Up by Means of Fault List Compression. Vol. 04 (2013) 407--421.

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