Analysis of the Effect of Hot Carrier Injection in An Integrated Inductive Voltage Regulator

Author:

Zhang Shida1,Mizanur Rahman Nael1,Chekuri Venkata Chaitanya Krishna1,Tokunaga Carlos2,Mukhopadhyay Saibal1

Affiliation:

1. Georgia Institute of Technology, United States

2. Intel Corporation, United States

Funder

Semiconductor Research Corporation

Publisher

ACM

Reference9 articles.

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. Analysis of Effects of Aging on the Accuracy of Analog Computing-In-Memory Computation;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08

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