Timing-based delay test for screening small delay defects

Author:

Ahmed Nisar,Tehranipoor Mohammad,Jayaram Vinay

Publisher

ACM Press

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. On Latent Defect Acceleration;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10

2. Hardware Trojans Detection and Prevention Techniques Review;Wireless Personal Communications;2024-05

3. Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis;2023 IEEE International Test Conference (ITC);2023-10-07

4. Optimal Test Clock Frequency Based Test Option Generation for Small Delay Defects;IEEE Access;2023

5. Dynamic Frequency Boosting Beyond Critical Path Delay;Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design;2022-10-30

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