Unifying Token- and Span-level Supervisions for Few-shot Sequence Labeling

Author:

Cheng Zifeng1ORCID,Zhou Qingyu2ORCID,Jiang Zhiwei1ORCID,Zhao Xuemin2ORCID,Cao Yunbo2ORCID,Gu Qing1ORCID

Affiliation:

1. State Key Laboratory for Novel Software Technology, Nanjing University, China

2. Tencent Cloud Xiaowei, China

Abstract

Few-shot sequence labeling aims to identify novel classes based on only a few labeled samples. Existing methods solve the data scarcity problem mainly by designing token-level or span-level labeling models based on metric learning. However, these methods are only trained at a single granularity (i.e., either token-level or span-level) and have some weaknesses of the corresponding granularity. In this article, we first unify token- and span-level supervisions and propose a Consistent Dual Adaptive Prototypical (CDAP) network for few-shot sequence labeling. CDAP contains the token- and span-level networks, jointly trained at different granularities. To align the outputs of two networks, we further propose a consistent loss to enable them to learn from each other. During the inference phase, we propose a consistent greedy inference algorithm that first adjusts the predicted probability and then greedily selects non-overlapping spans with maximum probability. Extensive experiments show that our model achieves new state-of-the-art results on three benchmark datasets. All the code and data of this work will be released at https://github.com/zifengcheng/CDAP .

Funder

National Natural Science Foundation of China

Collaborative Innovation Center of Novel Software Technology and Industrialization

Publisher

Association for Computing Machinery (ACM)

Subject

Computer Science Applications,General Business, Management and Accounting,Information Systems

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