Test-case reduction for C compiler bugs

Author:

Regehr John1,Chen Yang1,Cuoq Pascal2,Eide Eric1,Ellison Chucky3,Yang Xuejun1

Affiliation:

1. University of Utah, Salt Lake City, UT, USA

2. CEA LIST, Saclay, France

3. University of Illinois, Urbana, IL, USA

Publisher

ACM

Cited by 145 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Automated Feature Testing of Verilog Parsers using Fuzzing (Registered Report);Proceedings of the 3rd ACM International Fuzzing Workshop;2024-09-13

2. SQLess: Dialect-Agnostic SQL Query Simplification;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11

3. LPR: Large Language Models-Aided Program Reduction;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11

4. T-Rec: Fine-Grained Language-Agnostic Program Reduction Guided by Lexical Syntax;ACM Transactions on Software Engineering and Methodology;2024-08-30

5. Automatic build repair for test cases using incompatible Java versions;Information and Software Technology;2024-08

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