Digital Twin of Intelligent Small Surface Defect Detection with Cyber-Manufacturing Systems

Author:

Wu Yirui1,Cao Hao2,Yang Guoqiang3,Lu Tong3,Wan Shaohua4

Affiliation:

1. College of Computer and Information, Hohai University, China Key Laboratory of Symbolic Computation and Knowledge Engineering of Ministry of Education, Jilin University, China

2. College of Computer and Information, Hohai University, China

3. Key Laboratory for Novel Software Technology, Nanjing University, China

4. Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, China

Abstract

With the remarkable technological development in cyber-physical systems, industry 4.0 has evolved by a significant concept named as digital twin (DT). However, it’s still difficult to construct relationship between twin simulation and real scenario considering dynamic variations, especially when dealing with small surface defect detection tasks with high performance and computation resource requirement. In this paper, we aim to construct cyber-manufacturing systems to achieve a DT solution for small surface defect detection task. Focusing on DT based solution, the proposed system consists of an Edge-Cloud architecture and a surface defect detection algorithm. Considering dynamic characteristics and real-time response requirement, Edge-Cloud architecture is built to achieve smart manufacturing by efficiently collecting, processing, analyzing, and storing data produced by factory. A deep learning based algorithm is then constructed to detect surface defeats based on multi-modal data, i.e., imaging and depth data. Experiments show the proposed algorithm could achieve high accuracy and recall in small defeat detection task, thus constructing DT in cyber-manufacturing.

Publisher

Association for Computing Machinery (ACM)

Subject

Computer Networks and Communications

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