Author:
Fujii Atsushi,Utiyama Masao,Yamamoto Mikio,Utsuro Takehito
Cited by
7 articles.
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1. Patent Quality Valuation with Deep Learning Models;Database Systems for Advanced Applications;2018
2. Patent Mining;ACM SIGKDD Explorations Newsletter;2015-05-21
3. Learning to translate queries for CLIR;Proceedings of the 37th international ACM SIGIR conference on Research & development in information retrieval;2014-07-03
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5. Applicability and application of machine translation quality metrics in the patent field;World Patent Information;2013-06