Author:
Guzey Onur,Wang Li-C.,Levitt Jeremy,Foster Harry
Cited by
12 articles.
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1. Detecting Stimuli with Novel Temporal Patterns to Accelerate Functional Coverage Closure;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18
2. Survey of Machine Learning for Software-assisted Hardware Design Verification: Past, Present, and Prospect;ACM Transactions on Design Automation of Electronic Systems;2024-06-21
3. RTL Simulation Acceleration with Machine Learning Models;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03
4. Using Neural Networks for Novelty-based Test Selection to Accelerate Functional Coverage Closure;2023 IEEE International Conference On Artificial Intelligence Testing (AITest);2023-07
5. Test Sequences for Faults in the Scan Logic;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10