Comparing developer-provided to user-provided tests for fault localization and automated program repair

Author:

Just René1,Parnin Chris2,Drosos Ian3,Ernst Michael D.4

Affiliation:

1. University of Massachusetts at Amherst, USA

2. North Carolina State University, USA

3. University of California at San Diego, USA

4. University of Washington, USA

Publisher

ACM

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Exploring Data Cleanness in Defects4J and Its Influence on Fault Localization Efficiency;Proceedings of the 2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings;2024-04-14

2. A systematic mapping study of bug reproduction and localization;Information and Software Technology;2024-01

3. Impact analysis of bug localization accuracy oriented to bug report;Sixth International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2023);2023-08-16

4. Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction;2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE);2023-05

5. Better Automatic Program Repair by Using Bug Reports and Tests Together;2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE);2023-05

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