Electromagnetic Pattern Cluster in Latent Space in Near Filed Scanning of a Device
Author:
Affiliation:
1. Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, China
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3579654.3579679
Reference17 articles.
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2. Lotfi Beghou Bing Liu and Lionel Pichon. 2008. Synthesis of Equivalent 3D Models from Near-Field Measurements-Application to the EMC of Power Printed Circuit Boards. (2008). Lotfi Beghou Bing Liu and Lionel Pichon. 2008. Synthesis of Equivalent 3D Models from Near-Field Measurements-Application to the EMC of Power Printed Circuit Boards. (2008).
3. A Machine Learning Approach to Predict Supply and Temperature Variation Aware RF Integrated Circuit Interference Limitation
4. Analysis of Near-Field Shielding Effectiveness for the SiP Module;Gao L.;IEEE Transactions on Electromagnetic Compatibility PP,2018
5. Ian Goodfellow Jean Pouget-Abadie Mehdi Mirza Bing Xu David Warde-Farley Sherjil Ozair Aaron Courville and Y. Bengio. 2014. Generative Adversarial Nets. In Neural Information Processing Systems. Ian Goodfellow Jean Pouget-Abadie Mehdi Mirza Bing Xu David Warde-Farley Sherjil Ozair Aaron Courville and Y. Bengio. 2014. Generative Adversarial Nets. In Neural Information Processing Systems.
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