Infrared detector fault classification and prediction technology based on sensitive parameter learning-Reference-Cited by-同舟云学术

Infrared detector fault classification and prediction technology based on sensitive parameter learning

Published:2022-12-23 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 2022 5th International Conference on Algorithms, Computing and Artificial Intelligence
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Author:

Shi Linlin¹^ORCID,Yang Peiliang²^ORCID,Yu Pengfei³^ORCID,Lai Canxiong²^ORCID,Zhou Zhenwei²^ORCID,Hong Danni²^ORCID

Affiliation:

1. Huangpu Institute of Materials, China and The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China

2. The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China

3. South China University of Technology, China

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3579654.3579665

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