Toward optimal mc/dc test case generation-Reference-Cited by-同舟云学术

Toward optimal mc/dc test case generation

Published:2021-07-11 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
language:
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Author:

Godboley Sangharatna¹^ORCID,Jaffar Joxan²^ORCID,Maghareh Rasool³^ORCID,Dutta Arpita²^ORCID

Affiliation:

1. National Institute of Technology Warangal, India

2. National University of Singapore, Singapore

3. Huawei, Canada

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3460319.3464841

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4. GAIO ISO 26262 Compliant Unit Test Tool 2019. http://www.gaio.com/product/dev_tools/pdt07_winams.html GAIO ISO 26262 Compliant Unit Test Tool 2019. http://www.gaio.com/product/dev_tools/pdt07_winams.html

5. LDRA Software Technology 2019. http://www.gensoft-tr.com/getPDF.php?fn=downloads/ldra/tbsafe-modified-condition.pdf LDRA Software Technology 2019. http://www.gensoft-tr.com/getPDF.php?fn=downloads/ldra/tbsafe-modified-condition.pdf

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