Test Automation in a Test Factory

Author:

Vieira Lucas Sales1,Barreto Cayk G. Lima1,dos Santos Erick Barros2,Aragão Bruno Sabóia1,de Sousa Santos Ismayle3,Andrade Rossana M. Castro4

Affiliation:

1. Universidade Federal do Ceará GREat/UFC, Fortaleza, Ceará, Brasil and Bolsista da Fundação Cearense de Pesquisa e Cultura

2. Universidade Federal do Ceará GREat/UFC, Fortaleza, Ceará, Brasil and Bolsista de Mestrado do CNPq

3. Universidade Federal do Ceará GREat/UFC, Fortaleza, Ceará, Brasil

4. Universidade Federal do Ceará GREat/UFC, Fortaleza, Ceará, Brasil and Bolsista do CNPq de Produtividade em Desenvolvimento Tecnológico e Extensão Inovadora (DT) 2

Publisher

ACM Press

Reference17 articles.

1. Francisco Almenar, Anna I Esparcia-Alcázar, Mirella Martínez, and Urko Rueda. 2016. Automated testing of web applications with TESTAR. In International Symposium on Search Based Software Engineering. Springer, 218--223.

2. Bruno Aragão, Ismayle De Sousa Santos, Tales Nogueira, Lana Mesquita, and Rossana Andrade. 2017. Modelagem Interativa de um Processo de Desenvolvimento com Base na Percepção da Equipe: Um Relato de Experiência. In Anais do Simpósio Brasileiro de Sistemas de Informação (SBSI).

3. Eliane Collins, Arilo Dias-Neto, and Vicente F de Lucena Jr. 2012. Strategies for agile software testing automation: An industrial experience. In Computer Software and Applications Conference Workshops (COMPSACW). IEEE, 440--445.

4. Rossana Maria de Castro Andrade, Ismayle de Sousa Santos, Valéria Lelli, Káthia Marçal de Oliveira, and Ana Regina Rocha. 2017. Software Testing Process in a Test Factory - From Ad hoc Activities to an Organizational Standard. In 19th International Conference on Enterprise Information Systems. 132--143.

5. Dharmalingam Ganesan, Mikael Lindvall, Stefan Hafsteinsson, Rance Cleaveland, Susanne L Strege, and Walter Moleski. 2016. Experience report: Model-based test automation of a concurrent flight software bus. In Software Reliability Engineering (ISSRE), 2016 IEEE 27th International Symposium on. IEEE, 445--454.

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