CDF-LDPC

Author:

Qi Shigui1,Feng Dan1,Su Nan1,Mei Linjun1,Liu Jingning1

Affiliation:

1. Huazhong University of Science and Technology

Abstract

The raw error rate of a Solid-State drive (SSD) increases gradually with the increase of Program/Erase (P/E) cycles, retention time, and read cycles. Traditional approaches often use Error Correction Code (ECC) to ensure the reliability of SSDs. For error-free flash memory pages, time costs spent on ECC are redundant and make read performance suboptimal. This article presents a CRC-Detect-First LDPC (CDF-LDPC) algorithm to optimize the read performance of SSDs. The basic idea is to bypass Low-Density Parity-Check (LDPC) decoding of error-free flash memory pages, which can be found using a Cyclic Redundancy Check (CRC) code. Thus, error-free pages can be read directly without sacrificing the reliability of SSDs. Experiment results show that the read performance is improved more than 50% compared with traditional approaches. In particular, when idle time of benchmarks and SSD parallelism are exploited, CDF-LDPC can be performed more efficiently. In this case, the read performance of SSDs can be improved up to about 80% compared to that of the state-of-art.

Funder

863 Program

NSFC

Publisher

Association for Computing Machinery (ACM)

Subject

Hardware and Architecture

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Abakus: Accelerating k -mer Counting with Storage Technology;ACM Transactions on Architecture and Code Optimization;2024-01-18

2. Flash-Based Solid-State Storage Reduces LDPC Read Retry Scheme;Proceedings of the 7th International Conference on Computer Science and Application Engineering;2023-10-17

3. DECC;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16

4. Adaptive Differential Wearing for Read Performance Optimization on High-Density NAND Flash Memory;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023

5. DWR: Differential Wearing for Read Performance Optimization on High-Density NAND Flash Memory;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14

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