Different Classifiers Find Different Defects Although With Different Level of Consistency
Author:
Affiliation:
1. School of Technology Research Institute, Hatfield, Hertfordshire, AL10 9AB, United Kingdom
2. Dept. of Computer Science, Brunel University, Uxbridge, Middlesex, London, UB8 3PH, United Kingdom
Funder
Engineering and Physical Sciences Research Council
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2810146.2810149
Reference34 articles.
1. A systematic and comprehensive investigation of methods to build and evaluate fault prediction models
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