AIIO: Using Artificial Intelligence for Job-Level and Automatic I/O Performance Bottleneck Diagnosis
Author:
Affiliation:
1. Lawrence Berkeley National Laboratory, Berkeley, CA, USA
2. The Ohio State University & Lawrence Berkeley National Laboratory, Columbus, OH, USA
Funder
the U.S. Department of Energy (DOE)
Exascale Computing Project
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3588195.3592986
Reference56 articles.
1. Sercan Ö mer Arik and Tomas Pfister . 2019. TabNet: Attentive Interpretable Tabular Learning. CoRR , Vol. abs/ 1908 .07442 ( 2019 ). showeprint[arXiv]1908.07442 http://arxiv.org/abs/1908.07442 Sercan Ö mer Arik and Tomas Pfister. 2019. TabNet: Attentive Interpretable Tabular Learning. CoRR, Vol. abs/1908.07442 (2019). showeprint[arXiv]1908.07442 http://arxiv.org/abs/1908.07442
2. Dorian C. Arnold Dong H. Ahn Bronis R. de Supinski Gregory L. Lee Barton P. Miller and Martin Schulz. 2007. Stack Trace Analysis for Large Scale Debugging. In IPDPS. 1--10. https://doi.org/10.1109/IPDPS.2007.370254 10.1109/IPDPS.2007.370254
3. Dorian C. Arnold Dong H. Ahn Bronis R. de Supinski Gregory L. Lee Barton P. Miller and Martin Schulz. 2007. Stack Trace Analysis for Large Scale Debugging. In IPDPS. 1--10. https://doi.org/10.1109/IPDPS.2007.370254
4. Jiwoo Bang Chungyong Kim Kesheng Wu Alex Sim Suren Byna Hanul Sung and Hyeonsang Eom. 2021. An In-Depth I/O Pattern Analysis in HPC Systems. In HiPC. 400--405. https://doi.org/10.1109/HiPC53243.2021.00056 10.1109/HiPC53243.2021.00056
5. Jiwoo Bang Chungyong Kim Kesheng Wu Alex Sim Suren Byna Hanul Sung and Hyeonsang Eom. 2021. An In-Depth I/O Pattern Analysis in HPC Systems. In HiPC. 400--405. https://doi.org/10.1109/HiPC53243.2021.00056
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