Aggressive SRAM Voltage Scaling and Error Mitigation for Approximate DNN Inference

Author:

Kim Wootack1ORCID,Shim Minkyu1ORCID,Jung Hyunwoo1ORCID,Lee Youngki1ORCID

Affiliation:

1. Seoul National University, Republic of Korea

Publisher

ACM

Reference36 articles.

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4. FT-DeepNets: Fault-Tolerant Convolutional Neural Networks with Kernel-based Duplication

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