Affiliation:
1. Electrical and Computer Engineering, University of Delaware
Funder
Semiconductor Research Corporation
National Science Foundation
Cited by
8 articles.
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1. DiagNNose: Toward Error Localization in Deep Learning Hardware-Based on VTA-TVM Stack;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
2. Structural Coding: A Low-Cost Scheme to Protect CNNs from Large-Granularity Memory Faults;Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis;2023-11-11
3. NNTesting: Neural Network Fault Attacks Detection Using Gradient-Based Test Vector Generation;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09
4. Automatic Test Pattern Generation and Compaction for Deep Neural Networks;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16
5. Architecting Decentralization and Customizability in DNN Accelerators for Hardware Defect Adaptation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11