Reliability on Top of Best Effort Delivery

Author:

Bhowmik Biswajit,Deka Jatindra Kumar,Biswas Santosh

Publisher

ACM Press

Reference26 articles.

1. M. Agrawal and K. Chakrabarty. Test-time optimization in noc-based manycore socs using multicast routing. In VLSI Test Symposium (VTS), 2014 IEEE 32nd, pages 1--6, April 2014.

2. B. Bhowmik, S. Biswas, and J. K. Deka. Detection of faulty interswitch links in 2-D mesh Network-on-Chips. In 2014 Eighth IEEE International Conference on Advanced Networks and Telecommunications Systems (IEEE ANTS 2014), pages 1--6, New Delhi, India, Dec. 2014.

3. B. Bhowmik, S. Biswas, and J. K. Deka. An optimal diagnosis of noc interconnects on activation of diagonal routers. In 2015 28th IEEE International Conference on Systems, Man, and Cybernetics (IEEE SMC 2015), Hong Kong, October 2015.

4. B. Biswajit, S. Biswas, and J. K. Deka. A packet address driven test strategy for stuck-at faults in networks-on-chip interconnects. In Control and Automation (MED 2015), 2015 IEEE 23rd Mediterranean Conference on, Torremolinos, Spain.

5. B. Biswajit, S. Biswas, and J. K. Deka. A matrix model for redefining and testing noc interconnect shorts. In 2015 27th IEEE Tenth Region Conference (IEEE TENCON 2015), Macau, China, November 2015.

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Selective Fault-Masking for Improving Yield and Performance of On-Chip Networks;2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC);2021-10-17

2. Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks;Journal of Electronic Testing;2020-04-27

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