CLEAR-Reference-Cited by-同舟云学术

CLEAR

Published:2016-06-05 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 53rd Annual Design Automation Conference
language:
Short-container-title:

Author:

Cheng Eric¹,Mirkhani Shahrzad¹,Szafaryn Lukasz G.²,Cher Chen-Yong³,Cho Hyungmin¹,Skadron Kevin²,Stan Mircea R.²,Lilja Klas⁴,Abraham Jacob A.⁵,Bose Pradip³,Mitra Subhasish¹

Affiliation:

1. Stanford University

2. University of Virginia

3. IBM Research

4. Robust Chip, Inc.

5. University of Texas at Austin

Funder

Defense Advanced Research Projects Agency

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2897937.2897996

Reference55 articles.

1. {Amusan 09} Amusan O. A. "Effects of single-event-induced charge sharing in sub-100nm bulk CMOS technologies " Vanderbilt University Dissertation 2009. {Amusan 09} Amusan O. A. "Effects of single-event-induced charge sharing in sub-100nm bulk CMOS technologies " Vanderbilt University Dissertation 2009.

2. {Ando 03} Ando H. et al. "A 1.3-GHz fifth-generation SPARC64 microprocessor " IEEE Journal Solid-State Circuits 2003. {Ando 03} Ando H. et al. "A 1.3-GHz fifth-generation SPARC64 microprocessor " IEEE Journal Solid-State Circuits 2003.

3. Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

4. {Bosilca 09} Bosilca G. et al. "Algorithmic based fault tolerance applied to high performance computing " Journal of Parallel and Distributed Computing 2009. 10.1016/j.jpdc.2008.12.002 {Bosilca 09} Bosilca G. et al. "Algorithmic based fault tolerance applied to high performance computing " Journal of Parallel and Distributed Computing 2009. 10.1016/j.jpdc.2008.12.002

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