Author:
Lin Yung-Chieh,Lu Feng,Yang Kai,Cheng Kwang-Ting
Cited by
16 articles.
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1. Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines;2023 IEEE International Test Conference (ITC);2023-10-07
2. Covering Test Holes of Functional Broadside Tests;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
3. Intelligent design automation for 2.5/3D heterogeneous SoC integration;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02
4. LFSR‐based generation of boundary‐functional broadside tests;IET Computers & Digital Techniques;2019-09-25
5. Boundary-Functional Broadside and Skewed-Load Tests;ACM Transactions on Design Automation of Electronic Systems;2019-01-31