ICCAD-2016 CAD contest in pattern classification for integrated circuit design space analysis and benchmark suite-Reference-Cited by-同舟云学术

ICCAD-2016 CAD contest in pattern classification for integrated circuit design space analysis and benchmark suite

Published:2016-11-07 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 35th International Conference on Computer-Aided Design
language:
Short-container-title:

Author:

Topaloglu Rasit O.¹

Affiliation:

1. IBM

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2966986.2980073

Reference18 articles.

1. Y.-C. Lai F.E. Gennari M.W. Moskewicz J. Lei and W. Lai "Method and System for Performing Pattern Classification Of Patterns In Integrated Circuit Designs " US8 079 005. Y.-C. Lai F.E. Gennari M.W. Moskewicz J. Lei and W. Lai "Method and System for Performing Pattern Classification Of Patterns In Integrated Circuit Designs " US8 079 005.

2. M. Gabrani and P. Hurley "IC Layout Pattern Matching And Classification System And Method " US8 363 922. M. Gabrani and P. Hurley "IC Layout Pattern Matching And Classification System And Method " US8 363 922.

3. R.O. Topaloglu "Methods For Fabricating An Electrically Correct Integrated Circuit " US8 336 011. R.O. Topaloglu "Methods For Fabricating An Electrically Correct Integrated Circuit " US8 336 011.

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