Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation-Reference-Cited by-同舟云学术

Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation

Published:2016-11-07 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 35th International Conference on Computer-Aided Design
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Author:

Yu Handi¹,Tao Jun¹,Liao Changhai¹,Su Yangfeng¹,Zhou Dian²,Zeng Xuan¹,Li Xin³

Affiliation:

1. Fudan University, Shanghai, China

2. Fudan University, Shanghai, China and University of Texas at Dallas

3. Carnegie Mellon University

Funder

Key Technologies R&D Program

Recruitment Program of Global Experts (the Thousand Talents Plan)

National Science Foundation (NSF)

National Natural Science Foundation of China (NSFC)

Laboratory of Mathematics for Nonlinear Science, Fudan University

Publisher

ACM

Link

Reference18 articles.

3. Breaking the simulation barrier: SRAM evaluation through norm minimization;Dolecek L.;IEEE ICCAD,2008

4. Sequential importance sampling for low-probability and high dimensional SRAM yield analysis;Katayama K.;IEEE ICCAD,2010

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2. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation;Proceedings of the 54th Annual Design Automation Conference 2017;2017-06-18