Single-Layer Obstacle-Aware Substrate Routing via Iterative Pin Reassignment and Wire Assignment

Abstract

It is known that single-layer obstacle-aware substrate routing is necessary for modern IC/Package designs. In this article, given a set of two-pin nets and a set of rectangular obstacles inside a single-layer routing plane, a two-phase routing algorithm including an iterative routing phase and a rip-up-and-reroute phase can be proposed to maximize the number of the routed nets in single-layer obstacle-aware substrate routing. In the iterative routing phase, based on the pin and path distribution of the routing nets and the locations of the obstacles inside a single-layer routing plane, the start or target pins on some routing nets inside dense obstacle regions may be firstly reassigned to complete the partial wiring paths on the nets. Based on the region extraction of two intersected nets in single-layer routing, the private regions of some routing nets inside sparse obstacle regions can be extracted and the nets inside the extracted regions can be further routed by using maze routing. In the rip-up-and-reroute phase, the routability of the routing nets can be improved by ripping up some routed nets and rerouting the unrouted nets. Compared with Liu's modified algorithm and Yan's flow-based algorithm in single-layer obstacle-aware substrate routing, the experimental results show that the proposed algorithm can use less CPU time to increase 3.4% and 1.8% of the routability on the routing nets for eight tested examples on the average. Additionally, the percentage of the tested examples with the 100% routability of the routing nets on the eight tested examples has been improved from 25% to 62.5%.