Author:
Sreedhar Aswin,Sanyal Alodeep,Kundu Sandip
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Covering Test Holes of Functional Broadside Tests;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
2. Incomplete Tests for Undetectable Faults to Improve Test Set Quality;ACM Transactions on Design Automation of Electronic Systems;2019-03-21