A fast and accurate analytical technique to compute the AVF of sequential bits in a processor
Author:
Affiliation:
1. Intel, Hudson, MA
2. Nvidia, Westford, MA
3. Nvidia / MIT Westford, MA / Cambridge, MA
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2830772.2830829
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4. N. Seifert V. Ambrose B. Gill Q. Shi R. Allmon C. Recchia S. Mukherjee N. Nassif J. Krause J. Pickholtz A. Balasubramanian "On the Radiation-induced Soft Error Performance of Hardened Sequential Elements in Advanced Bulk CMOS Technologies" invited paper proceedings of the IEEE International Reliability Physics Symposium (IRPS) pp. 188--197 2010 N. Seifert V. Ambrose B. Gill Q. Shi R. Allmon C. Recchia S. Mukherjee N. Nassif J. Krause J. Pickholtz A. Balasubramanian "On the Radiation-induced Soft Error Performance of Hardened Sequential Elements in Advanced Bulk CMOS Technologies" invited paper proceedings of the IEEE International Reliability Physics Symposium (IRPS) pp. 188--197 2010
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