Automatically Localizing Dynamic Code Generation Bugs in JIT Compiler Back-End

Author:

Lim HeuiChan1,Debray Saumya1

Affiliation:

1. University of Arizona, USA

Funder

National Science Foundation

Publisher

ACM

Reference30 articles.

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3. bugzilla.mozilla.org. n.d.. Bug Writing Guidelines. https://bugzilla.mozilla.org/page.cgi?id=bug-writing.html bugzilla.mozilla.org. n.d.. Bug Writing Guidelines. https://bugzilla.mozilla.org/page.cgi?id=bug-writing.html

4. Junjie Chen , Jiaqi Han , Peiyi Sun , Lingming Zhang , Dan Hao , and Lu Zhang . 2019 . Compiler bug isolation via effective witness test program generation . In Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019 , Tallinn, Estonia , August 26-30, 2019, Marlon Dumas, Dietmar Pfahl, Sven Apel, and Alessandra Russo (Eds.). ACM, 223–234. https://doi.org/10.1145/3338906.3338957 10.1145/3338906.3338957 10.1145/3338906.3338957 Junjie Chen, Jiaqi Han, Peiyi Sun, Lingming Zhang, Dan Hao, and Lu Zhang. 2019. Compiler bug isolation via effective witness test program generation. In Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019, Marlon Dumas, Dietmar Pfahl, Sven Apel, and Alessandra Russo (Eds.). ACM, 223–234. https://doi.org/10.1145/3338906.3338957 10.1145/3338906.3338957

5. Junjie Chen , Haoyang Ma , and Lingming Zhang . 2020 . Enhanced Compiler Bug Isolation via Memoized Search . In 35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020 , Melbourne, Australia , September 21-25, 2020. IEEE, 78–89. https://doi.org/10.1145/3324884.3416570 10.1145/3324884.3416570 10.1145/3324884.3416570 Junjie Chen, Haoyang Ma, and Lingming Zhang. 2020. Enhanced Compiler Bug Isolation via Memoized Search. In 35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020, Melbourne, Australia, September 21-25, 2020. IEEE, 78–89. https://doi.org/10.1145/3324884.3416570 10.1145/3324884.3416570

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