Author:
Wang Nicholas J.,Mahesri Aqeel,Patel Sanjay J.
Cited by
16 articles.
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1. Multi-Level Fault Injection Methodology Using UVM-SystemC;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
2. Reliability assessment of FreeRTOS in Embedded Systems;2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2022-06
3. Flodam: Cross-Layer Reliability Analysis Flow for Complex Hardware Designs;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14
4. Boosting Microprocessor Efficiency: Circuit- and Workload-Aware Assessment of Timing Errors;2021 IEEE International Symposium on Workload Characterization (IISWC);2021-11
5. Cross-Layer Resilience Against Soft Errors: Key Insights;Dependable Embedded Systems;2020-12-10