The Best of Both Worlds
Author:
Affiliation:
1. The Chinese University of Hong Kong, Department of Computer Science and Engineering, Hong Kong
2. Academia Sinica, Institute of Information Science, Taipei, Taiwan
Funder
he Research Grants Council of Hong Kong SAR
Ministry of Science and Technology, R.O.C.
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3316781.3317922
Reference18 articles.
1. JEDEC Solid State Technology Assn. 2016. Failure Mechanisms and Models for Semiconductor Devices. In Publication JEP122H. JEDEC Solid State Technology Assn. 2016. Failure Mechanisms and Models for Semiconductor Devices. In Publication JEP122H.
2. TPC benchmark. 2018. TPC benchmark@ONLINE http://www.tpc.org/information/benchmarks.asp. TPC benchmark. 2018. TPC benchmark@ONLINE http://www.tpc.org/information/benchmarks.asp.
3. Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime
4. A Management Strategy for the Reliability and Performance Improvement of MLC-Based Flash-Memory Storage Systems
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