Attacking Split Manufacturing from a Deep Learning Perspective-Reference-Cited by-同舟云学术

Attacking Split Manufacturing from a Deep Learning Perspective

Published:2019-06-02 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 56th Annual Design Automation Conference 2019
language:
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Author:

Li Haocheng¹,Patnaik Satwik²,Sengupta Abhrajit²,Yang Haoyu¹,Knechtel Johann³,Yu Bei¹,Young Evangeline F.Y.¹,Sinanoglu Ozgur³

Affiliation:

1. CUHK

2. NYU

3. NYU Abu Dhabi

Funder

Research Grants Council, University Grants Committee

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3316781.3317780

Reference23 articles.

1. The cat and mouse in split manufacturing;Wang Y.;IEEE TVLSI,2018

2. On the approximation resiliency of logic locking and IC camouflaging schemes;Shamsi K.;IEEE TIFS,2019

3. From improved leakage detection to the detection of points of interests in leakage traces;Standaert F.-X.;EUROCRYPT,2016

4. C. McCants "Trusted integrated chips (TIC) " Intelligence Advanced Research Projects Activity (IARPA) Tech. Rep. 2011. C. McCants "Trusted integrated chips (TIC) " Intelligence Advanced Research Projects Activity (IARPA) Tech. Rep. 2011.

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